Technical Committees - 2014

See year 2015 slots
See year 2013 slots

1. Automotive Technology

Sheldon Williamson - Chair

2. Building Automation, Control and Management

Jan Haase - Chair
Web page: http://ieee-ies.org/tc/bacm/

3. Control, Robotics and Mechatronics

Peter Korondi- Chair
Web page: http://dfs.iis.u-tokyo.ac.jp/iestc/

4. Data Driven Control and Monitoring

Shen Yin - Chair

5. Education in Engineering and Industrial Technologies

Joao Martins - Chair
Web page: http://eeit.ieee-ies.org

6. Electrical Machines

Andrea Cavagnino - Chair
Web page: http://www.uta.edu/pecm/ies/

7. Electronic Systems on Chip (ESOC)

Marc Perron - Chair
Web page: http://ieee-ies.org/tc/esoc/

8. Energy Storage

Mo Yuen Chow - Chair
Web page: http://umji.sjtu.edu.cn/personal/chbma/ieeetces/

9. Factory Automation

Lucia Lo Bello - Chair
Web page:Â http://ies-tcfa.dieei.unict.it/

10. Human Factors

Kang Hyun Jo - Chair
Web page: http://www.ieee-tc-hf.org/

11. Industrial Agents

Paulo Leitao - Chair
Web page: http://tcia.ieee-ies.org/

12. Industrial Informatics

Elizabeth Chang - Chair
Web page: http://tc-ii.ieee-ies.org

13. MEMS & Nanotechnologies

Stoyan Nihtianov - Chair
Web page: http://tc.ieee-ies.org/tc/mems

14. Motion Control

Roberto Oboe - Chair
Web page: http://mechatro.elcom.nitech.ac.jp/ieee-ies-tcmc/

15. Network-based Control Systems and Applications

Qing-Long Han - Chair
Web page: http://nbcs.ieee-ies.org/

16. Power Electronics Technical Committee (PETC)

Chandan Chakraborty - Chair
Web page: http://conf05.iitkgp.ac.in/pes/

17. Renewable Energy Systems

Giovanni Spagnuolo - Chair
Web page: http://res.ieee-ies.org/

18. Resilience and Security for Industrial Applications (ReSia)

Milos Manic - Chair
Web page: http://resia.ieee-ies.org/

19. Sensors and Actuators

Toshiyuki Murakami - Chair
Web page: http://www.fujilab.dnj.ynu.ac.jp/TC-SA/

20. Smart Grids

Marcelo Simoes - Chair
Web page: https://sites.google.com/site/ieeeiestconsmartgrids/home

21. Standards

Victor Huang, Better World - Chair
Web page: Standards Committee

Remarks