IEEE Industrial Electronics Magazine

Announcements
At this time of health crisis worldwide, our magazine continues to operate normally. We however recognize that many of our authors, reviewers and editors are affected in one way or the other by the Covid-19 spread. If you have difficulties to meet a set deadline for any of your tasks, like review of a paper or submission of a revised version, extensions can be granted on a case by case basis. Please contact the Magazine assistant Jose Rueda J.L.RuedaTorres@tudelft.nl. I wish you and your family good health.
Peter Palensky
Scope
IEEE Industrial Electronics Magazine (IEM) publishes peer-reviewed articles that present emerging trends and practices in industrial electronics product research and development, key insights, and tutorial surveys in the field of interest to the membership of the IEEE Industrial Electronics Society (IEEE/IES). IEM is limited to the scope of the IES which is given as theory and applications of electronics, controls, communications, instrumentation and computational intelligence to industrial and manufacturing systems and processes.
Editorial Board
Editor-in-Chief

Prof. Eric Monmasson
- CY Cergy Paris University
- SATIE Lab.
- Rue d’Eragny, 95031 Cergy-Pontoise
- France
- Email: eric.monmasson-at-cyu.fr
- Phone: +33 1 34 25 68 91
- Fax: +33 1 34 25 69 01
Past Editor-in-Chief

Prof. Dr. Peter Palensky
- TU Delft
- Chair Intelligent Electrical Power Grids
- Mekelweg 4, 2628CD Delft
- Netherlands
Complete Editorial Board is listed here
Journal administrator

Dr. José Rueda
- TU Delft
- Associate Professor Resilient Sustainable Energy Systems
- Mekelweg 4, 2628CD Delft
- Netherlands
Information for Authors
Submit your Paper View on IEEE Xplore
Policies and guidelines
- ORCID is required for all authors
- IES Periodicals Editorial Policy and Guidelines
- Excerpt from IEEE publication policy (All IEEE IPR guidelines)
- Multiple Submission Guidelines (Excerpt from IEEE PSPB Operations Manual)
- IEEE Author Center: IEEE author platform with tools and information.
Read the IEEE IEM on IEEE Xplore