FOUNDER EDITOR-IN-CHIEF


Leopoldo G. Franquelo
Professor, Electronics Engineering
Dpto de Ingeniería Electrónica
Universidad de Sevilla
Spain
lgfranquelo@ieee.org

CO-EDITOR-IN-CHIEF


Armando W. Colombo
Professor, Institute for Industrial Informatics
Automation and Robotics (I2AR)
University of Applied Sciences Emden/Leer
Germany



ASSOCIATE EDITORS


Haitham Abu-Rub
Texas A&M University at Qatar, Qatar

Ebrahim Babaei
University of Tabriz, Iran

Federico Baronti
University of Pisa, Italy

Ali Kashif Bashir
Manchester Metropolitan University, UK

Thiago Batista Soeiro
Delft University of Technology, Netherlands

Sertac Bayhan
Hamad Bin Khalifa University, Qatar

Danilo I. Brandao
Universidade Federal de Minas Gerais, Brazil

Giampaolo Buticchi
University of Nottingham, China

Maria-Laura Caliusco
UTN - Facultad Regional Santa Fe, Argentina

Xi Chen
GEIRI North America, USA

Claudia-Melania Chituc
DIPF Leibniz-Institut für Bildungsforschung, Germany

Doriana Marilena D'Addona
University of Naples Federico II, Italy

Daswin De Silva
La Trobe University, Australia

Anton Dianov
Samsung Electronics, Republic of Korea

Yuemin Ding
University of Navarra, Spain

Hairong Dong
Beijing Jiaotong University, China

Huazhen Fang
University of Kansas School of Engineering, USA

Francisco Freijedo
Huawei Technologies, Germany

Lefei Ge
Northwestern Polytechnical University, China

Saeed Golestan
Aalborg Universitet, Denmark

Luis Gomes
University NOVA of Lisbon, Portugal

Gerhard Petrus Hancke
City University of Hong Kong, Hong Kong, China

Juergen Jasperneite
Fraunhofer Society (Fraunhofer IOSB-INA), Germany

Stamatis Karnouskos
SAP, Germany

Ritesh Kumar Keshri
Visvesvaraya National Institute of Technology, India

Chandan Kumar
Indian Institute of Technology Guwahati, India

Jin-Gang Lai
RWTH Aachen University, Germany

Chi-Seng Lam
University of Macau, Macau, China

Paulo Leitao
Instituto Politecnico de Braganca, Portugal

Binbin Li
Harbin Institute of Technology, China

Hong Li
Beijing Jiaotong University, China

Chunhua Liu
City University of Hong Kong, Hong Kong, China

Yushan Liu
Beihang University, China

Andrei Lobov
Norwegian University of Science and Technology, Norway

Oscar Lucia
Universidad de Zaragoza, Spain

Aleksander Malinowski
Bradley University, USA

Milos Manic
Virginia Commonwealth University, USA

Antonio J. Marques Cardoso
CISE | University of Beira Interior (UBI), Portugal

Saad Mekhilef
University of Malaya, Malaysia

Eric Monmasson
University of Cergy-Pontoise, France

Peter Palensky
TU Delft, Netherlands

Edris Pouresmaeil
Aalto University, Finland

Lin Qiu
University of Illinois Urbana-Champaign, United States

Luis Ribeiro
Linköpings universitet, Sweden

Marco Rivera
Universidad de Talca, Chile

Juan Jose Rodriguez-Andina
Universidad de Vigo, Spain

Xinbo Ruan
Nanjing University of Aeronautics and Astronautics, China

Yang Shi
University of Victoria, Canada

Lei Shu
Nanjing Agricultural University, China

Pierluigi Siano
University of Salerno, Italy

Jorge Solsona
UNS-CONICET, Argentina

Giovanni Spagnuolo
University of Salerno, Italy

Thomas I. Strasser
AIT Austrian Inst. of Technology, Austria

Xiaodong Sun
Jiangsu University, China

Hiralal Suryawanshi
Visvesvaraya National Insitute of Technology, India

Hani Vahedi
TU Delft, Netherlands

María Dolores Valdés Peña
Universidad de Vigo, Spain

Dmitri Vinnikov
Tallinn University of Technology, Estonia

Valeriy Vyatkin
Aalto University, Finland and Luleå University of Technology, Sweden

Shuihua Wang
University of Leicester, UK

Guanghui Wen
RMIT University, Australia

Sheldon Williamson
Ontario Tech University, Canada

Weiliang Xu
The University of Auckland, New Zealand

Jun Yang
Loughborough University, UK

Xinghu Yu
Ningbo Institute of Intelligent Equipment Technology Company Ltd., China

Hui Zhang
Beihang University, China

Jingbing Zhang
Advanced Remanufacturing and Technology Centre, Singapore

Zhen Zhang
Tianjin University, China

Xing Zhao
University of York, UK

Article Submission

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More about us:

  • Rapid turnaround: The peer review process takes 4-6 weeks from submission to accept/reject decision notification.
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Open Access

This journal is 100% open access, which means that all content is freely available without charge to users or their institutions. All articles are published under a CC BY 4.0 license (or CCBY-NC-ND, learn more about the license options here), and the author retains copyright. Users are allowed to read, download, copy, distribute, print, search, or link to the full texts of the articles, or use them for any other lawful purpose, as long as proper attribution is given.

Open access is provided through the payment of an article processing charge (APC) paid after acceptance. APCs are often financed by an author's institution or the funder supporting their research.

The articles in this journal are peer reviewed in accordance with the requirements set forth in the IEEE PSPB Operations Manual (sections 8.2.1.C & 8.2.2.A). Each published article was reviewed by a minimum of two independent reviewers using a single-blind peer review process, where the identities of the reviewers are not known to the authors, but the reviewers know the identities of the authors. Articles will be screened for plagiarism before acceptance.

Corresponding authors from low income countries are eligible for waived or reduced APCs.

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All IEEE authors are expected to adhere to IEEE’s publishing ethics, including the definition of authorship, the appropriate citation of sources, the accurate reporting of data, and the publishing of original research. Visit the IEEE Author Center to learn more. All articles submitted for publication should be original and not under consideration elsewhere; if your article is based on a previous publication such as a conference proceeding, cite the original publication and clearly indicate how the articles differ. Contact the Editor-in-Chief with any questions on publishing ethics.


ORCID

All IEEE journals require an Open Researcher and Contributor ID (ORCID) for all authors. ORCID is a persistent unique identifier for researchers and functions similarly to an article’s Digital Object Identifier (DOI). You will need a registered ORCID to submit an article or review a proof in this journal. Learn more about ORCID and sign up for an ORCID today.


English Language Editing Services

English language editing services can help refine the language of your article and reduce the risk of rejection without review. IEEE authors are eligible for discounts at several language editing services; visit the IEEE Author Center to learn more. Please note these services are fee-based and do not guarantee acceptance.


Share Your Code and Data

Increase the impact of your work by sharing your code and data for others to view, build upon, and reuse. IEEE works with Code Ocean, a cloud-based computational reproducibility platform, to make your code discoverable. IEEE DataPort, an online data repository of datasets and data analysis tools, makes your datasets discoverable. Visit the IEEE Author Center for more information.


IEEE Author Tools

Preparing your article for submission is easy with IEEE Author Tools. Tools are available to help you find the right publication for your research, check the quality of your graphics, validate your LaTeX files, and verify your reference list.


Video Tutorials from IEEE Author Center

Make your article more discoverable and attractive to readers with tips from the new Best Practices for Writing Your Article’s Title and Abstract course.

More Video Tutorials available on the IEEE Author Center.


Article Processing Charges (APCs) Oct. 2022 updated

The APC for this journal is $1950 per article (effective 1 January 2023), plus applicable local taxes. 2023 APC pricing is based upon articles submitted in 2023. Articles submitted in 2022 will maintain the 2022 APC pricing when billed. This journal has no page limits.

APC reductions:
  • IEEE’s APC discounts include 5% off for IEEE members or 20% off for Industrial Electronics Society members. These discounts cannot be combined.
  • Authors from low-income and lower-middle-income countries are eligible for possible waivers and discounts.
  • For a limited time, the IES is subsidizing the APC for Associate Editors and reviewers of OJIES to offer a special rate of 100% off, as they collaborate with the journal. This offer cannot be combined with any discounts.

Visit our Article Processing Charges page to learn more.


License options in the electronic IEEE Copyright Form:

  • CCBY: The CCBY license allows authors to retain copyright in the work, but also carries very broad rights for end users. For instance, end users may reuse the work and must always credit the original author. But the end user does not have to obtain permission from the author to reuse the work, even for commercial purposes or to create derivative works.
  • CCBY-NC-ND: similar to the CCBY license, in that authors are allowed to retain copyright to their work, and end users may reuse the work, provided that they credit the original author. The end user does not have to obtain permission from the authors or IEEE to reuse the work, but the reuse cannot be for commercial purposes or change the work in any way.

Post-Acceptance

If your article is accepted for publication, you will receive emailed instructions regarding your next steps. You may be asked to upload final production-ready files. Shortly after final files are uploaded, you will receive your article proofs for final review, along with instructions on how to review your proofs and submit any corrections. Please note that major changes to your article, including the list of references, are not permitted after the article is accepted for publication. Please contact the Editor-in-Chief if you have any doubts about whether a modification you wish to make is appropriate.





Nov. 2020


Call for applications to become Associate Editor of the OJIES

Call closed
A call for applications to become Associate Editor of the OJIES is now open. To be considered for an AE position, please fill in our Application Form and return it to Mr Raul Roman (raul.romanp@ieee-ies.org), no later than 5 December 2020.




Oct. 2022 updated

What fees are charged for an OJIES publication?

The APC for this journal is $1950 per article (effective 1 January 2023), plus applicable local taxes. 2023 APC pricing is based upon articles submitted in 2023. Articles submitted in 2022 will maintain the 2022 APC pricing when billed. This journal has no page limits.


Does IEEE or IES members have an APC discount?

Yes. IEEE will apply a discount to current IEEE members. IEEE members will receive a 5% discount, and members of IES will receive a 20% discount. These discounts cannot be combined.


Does OJIES have APC discounts for low-income countries?

Yes. Authors from low-income and lower-middle-income countries are eligible for possible waivers and discounts on open access article processing charges. Learn more here.


Does OJIES have an APC waiver policy for contributors?

Yes. For a limited time, the IES is subsidizing the APC for Associate Editors and reviewers of OJIES to offer a special rate of 100% off, as they collaborate with the journal. This offer cannot be combined with any discounts.







For an individual to be listed as a co-author, it is mandatory from 15 May 2022 that the primary e-mail address is an institutional one. This applies not only to the submitting author but to ALL authors of each and every paper. Papers where this requirement is not satisfied will not be put into the review process.

To ensure compliance with this requirement the submitting author should, prior to the submission, contact all co-authors and request that they, if necessary, edit contact details in their S1M accounts. Non-institutional e-mails can only be used as the Primary CC e-mail address from this date onward.


How to update the emails on S1M

Add your institutional email on the "Primary E-Mail Address" field. By including non-institutional emails as "Primary CC E-Mail Address", as shown in the picture, the user will receive a copy of the messages sent from S1M.


Examples of not allowed emails:

  • ...@gmail.com
  • ...@163.com
  • ...@qq.com
  • ...@126.com
  • ...@yahoo.com
  • ...@hotmail.com

Examples of allowed emails:

  • ...@ieee.org
  • ...@[university-emails]
  • ...@[industry-emails]